An approximate multi-beam form of the "ellipse" in high-resolution transmission electron microscopy

被引：2

作者：

Hu, JJ ^{[1
]}

Tanaka, N ^{[1
]}

机构：

[1] Nagoya Univ, Grad Sch Engn, Dept Appl Phys, Chikusa Ku, Nagoya, Aichi 4648603, Japan

来源：

ULTRAMICROSCOPY | 1998年 / 74卷 / 03期

基金：

日本学术振兴会;

关键词：

multi-beam images; ellipse" form; HREM; phase-grating approximation;

D O I：

10.1016/S0304-3991(98)00032-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The concept of "ellipse", appearing in recent studies of high-resolution transmission electron microscopy, is newly defined as the curves in the Fourier transform patterns of the images caused by many beams by plotting the intensities of diffracted beams vs. the transmitted beam. The present approximate ellipsoidal path can also be derived by using the phase-grating approximation and Sayre's relation, but without the two-Bloch-waves assumption. Its validity is examined from the data obtained by Fourier transforming the multi-slice simulated images of silicon [110], and gives a valuable issue for quantitative image analysis in diffraction space. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：105 / 111

页数：7

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