Recent developments in SiC device research

被引:32
作者
Harris, CI [1 ]
Konstantinov, AO [1 ]
机构
[1] Ind Microelect Ctr, S-16440 Kista, Sweden
来源
PHYSICA SCRIPTA | 1999年 / T79卷
关键词
D O I
10.1238/Physica.Topical.079a00027
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Silicon Carbide is fast emerging as a mature semiconductor. The unique combination of material properties offered by SIC will allow it to establish itself in applications where the ever dominant Si is approaching the physical (not technical) limits of it's operation. Three key areas will be explored in this paper: (i) High power electronics. SG devices operating at several kV and capable of MW power handling will revolutionise the way electrical power is transmitted and made use of. Recent progress supported by ABB in Sweden suggests these breakthroughs will begin to play a key rob soon after the turn of the century. (ii) High frequency devices made from SiC will also play an increasingly important part in the mobile telecommunication revolution in which we currently live. Northrop Grumman in the USA have demonstrated the transmission of digital TV using SIC based devices. The high power density achieved from such devices make them also suitable for base stations for mobile telephones. (iii) Finally we look at some examples of how SiC is being used to develop new types of sensors that can be used in extreme environments such as high temperatures, high pressures or corrosive environments. Feedback from such sensors is seen as essential to understanding how we effect the world around us and thereby how we can limit pollution.
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收藏
页码:27 / 31
页数:5
相关论文
共 24 条
[1]   1400V 4H-SiC power MOSFETs [J].
Agarwal, AK ;
Casady, JB ;
Rowland, LB ;
Valek, WF ;
Brandt, CD .
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 :989-992
[2]   SEMICONDUCTORS FOR HIGH-VOLTAGE, VERTICAL CHANNEL FIELD-EFFECT TRANSISTORS [J].
BALIGA, BJ .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :1759-1764
[3]   COMPARISON OF 6H-SIC, 3C-SIC, AND SI FOR POWER DEVICES [J].
BHATNAGAR, M ;
BALIGA, BJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (03) :645-655
[4]   Junction barrier Schottky diodes in 4H-SiC and 6H-SiC [J].
Dahlquist, F ;
Zetterling, CM ;
Ostling, M ;
Rottner, K .
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 :1061-1064
[5]  
IRVINE KG, SPRING 1998 MAT RES
[6]  
Itoh A, 1996, INST PHYS CONF SER, V142, P689
[7]  
JOHNSON EO, 1965, RCA REV, V26, P163
[8]   A 4.5 KV 6H SILICON-CARBIDE RECTIFIER [J].
KORDINA, O ;
BERGMAN, JP ;
HENRY, A ;
JANZEN, E ;
SAVAGE, S ;
ANDRE, J ;
RAMBERG, LP ;
LINDEFELT, U ;
HERMANSSON, W ;
BERGMAN, K .
APPLIED PHYSICS LETTERS, 1995, 67 (11) :1561-1563
[9]   PHYSICS WITH CATALYTIC METAL GATE CHEMICAL SENSORS [J].
LUNDSTROM, I ;
ARMGARTH, M ;
PETERSSON, LG .
CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 1989, 15 (03) :201-278
[10]   Characterization of power MESFETs on 4H-SiC conductive and semi-insulating wafers [J].
Noblanc, O ;
Arnodo, C ;
Chartier, E ;
Brylinski, C .
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 :949-952