Interpretation of capillary generated spatial and angular distributions of x rays: Theoretical modeling and experimental verification using the European Synchrotron Radiation Facility Optical beam line

被引:42
作者
Vincze, L [1 ]
Janssens, K
Adams, F
Rindby, A
Engstrom, P
机构
[1] Univ Antwerp, Dept Chem, B-2610 Antwerp, Belgium
[2] Chalmers Univ Technol, Dept Phys, S-41296 Gothenburg, Sweden
[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
D O I
10.1063/1.1149127
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Using a detailed ray-tracing code for capillary optics, interpretation is given for parallel bore hole and tapered capillary generated far-field images. These images can be used to indicate the presence of various types of surface imperfections (i.e., surface roughness or waviness) or shape distortions of the optical device. The capillary output patterns were recorded at the optical beam line of the European Synchrotron Radiation Facility by using a monochromatic, highly parallel incident synchrotron beam. Capillaries of various dimensions were studied, with inlet diameters in the range of 30-70 mu m, outlet diameters of 22-42 mu m and capillary length values ranging from 10 to 23 cm. mm, The far-field images were taken at a distance of 10-11 cm from the capillary exit using a high resolution charge coupled device camera. By comparisons of simulated and experimental capillary output patterns, the effects of surface roughness/waviness, as well as axial distortions are studied with respect to the angular distribution of the generated capillary beam. (C) 1998 American Institute of Physics. [S0034-6748(98)04509-2].
引用
收藏
页码:3494 / 3503
页数:10
相关论文
共 23 条
[1]  
[Anonymous], 1991, THEORY WAVE SCATTERI
[2]   IMPROVED CAPILLARY OPTICS APPLIED TO MICROBEAM X-RAY-FLUORESCENCE - RESOLUTION AND SENSITIVITY [J].
ATTAELMANAN, A ;
VOGLIS, P ;
RINDBY, A ;
LARSSON, S ;
ENGSTROM, P .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (01) :24-27
[3]   X-RAY OPTICS OF TAPERED CAPILLARIES [J].
BALAIC, DX ;
NUGENT, KA .
APPLIED OPTICS, 1995, 34 (31) :7263-7272
[4]   X-RAY APPLICATIONS WITH GLASS-CAPILLARY OPTICS [J].
BILDERBACK, DH ;
THIEL, DJ ;
PAHL, R ;
BRISTER, KE .
JOURNAL OF SYNCHROTRON RADIATION, 1994, 1 :37-42
[5]   NANOMETER SPATIAL-RESOLUTION ACHIEVED IN HARD X-RAY-IMAGING AND LAUE DIFFRACTION EXPERIMENTS [J].
BILDERBACK, DH ;
HOFFMAN, SA ;
THIEL, DJ .
SCIENCE, 1994, 263 (5144) :201-203
[6]  
CARGILL GS, 1995, P SOC PHOTO-OPT INS, V2516, P2516
[7]   RAY-TRACING OF X-RAY FOCUSING CAPILLARIES [J].
CHEN, GJ ;
CERRINA, F ;
VOSS, KF ;
KIM, KH ;
BROWN, FC .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 347 (1-3) :407-411
[8]  
ENGSTROM P, 1997, ESRF HIGHLIGHTS 1996, P79
[9]  
Engstrom P., 1991, THESIS CHALMERS U TE
[10]   THEORETICAL CONSIDERATION OF INTENSITY OF AN X-RAY MICROBEAM FORMED BY A HOLLOW GLASS PIPE [J].
FURUTA, K ;
NAKAYAMA, Y ;
SHOJI, M ;
KAIGAWA, R ;
HANAMOTO, K ;
NAKANO, H ;
HOSOKAWA, Y .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (01) :135-142