Characterization of AFM tips using nanografting

被引：20

作者：

Xu, S ^{[1
]}

Amro, NA ^{[1
]}

Liu, GY ^{[1
]}

机构：

[1] Wayne State Univ, Dept Chem, Detroit, MI 48202 USA

来源：

APPLIED SURFACE SCIENCE | 2001年 / 175卷

基金：

美国国家科学基金会;

关键词：

tip characterization; nanografting; nanofabrication; deconvolution; atomic force microscopy; self-assembled monolayer;

D O I：

10.1016/S0169-4332(01)00116-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We introduce a new method, nanografting, to characterize atomic force microscopy tips. Our technique includes three main steps. First, a self-assembled monolayer (SAM) of thiol is imaged using AFM with a low imaging force. Second, under a high load, a line of new thiols is fabricated within the matrix SAM in a single scan. Finally, the resulting line is imaged by the same AFM tip under a reduced force. From the topographic image of the line, one can extract information regarding the top portion of the AFM tip and the tip-surface contact area during fabrication. The advantages of this approach include its simplicity, high speed. and the ability to characterize the very top portion of the tip. In addition, tips with multiple asperities, which are difficult to investigate using other approaches, can be easily identified and characterized via nanografting. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：649 / 655

页数：7

共 46 条

[1] TIP-RADIUS-INDUCED ARTIFACTS IN AFM IMAGES OF PROTAMINE-COMPLEXED DNA FIBERS [J].