Structure and defects in thin C60 films

被引：6

作者：

Manaila, R ^{[1
]}

Geru, II

Fratiloiu, D

Spoiala, DM

Dihor, IT

Devenyi, A

机构：

[1] Natl Inst Phys Mat, Bucharest, Romania

[2] Kishinev State Univ, Kishinev, Moldova

来源：

FULLERENE SCIENCE AND TECHNOLOGY | 1999年 / 7卷 / 01期

关键词：

D O I：

10.1080/10641229909350270

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Thin C-60 films were deposited by vacuum sublimation of soot on single-crystal and amorphous substrates. The absence of higher fullerenes was confirmed by IR, Raman and UV-VIS spectroscopy. X-ray diffraction revealed a high density of stacking faults (probabilities in the range 10(-2)), correlated with lattice distortions. Analysis of the W-VIS absorption bands yielded values of the h(u)-->t(1g) and h(u)-->t(1u) optical gaps.

引用

页码：59 / 75

页数：17

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