共 10 条
[1]
*ASM INT, 1988, MET HDB, V13, P212
[2]
*ASTM, 1996, 11795 ASTM B
[4]
FUKUTOMI K, 1984, KINZOKU HYOMEN GIJUS, V35, P45
[5]
KADO T, 1987, BOSHOKU GIJUSTU, V36, P551
[6]
OKAMOTO T, 1996, CORROS ENG, V45, P425
[8]
TAKIZAWA K, 1991, HYOMEN GIJUSTU, V42, P1255
[9]
TAKIZAWA K, 1991, HYOMEN GIJUSTU, V42, P1152
[10]
Electrochemical evaluation of pinhole defects in TiN films prepared by r.f. reactive sputtering
[J].
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING,
1997, 234
:649-652