Full-field transmission x-ray microscopy at SSRL

被引：13

作者：

Andrews, J. C. ^{[1
]}

Brennan, S. ^{[1
]}

Pianetta, P. ^{[1
]}

Ishii, H. ^{[2
]}

Gelb, J. ^{[3
]}

Feser, M. ^{[3
]}

Rudati, J. ^{[3
]}

Tkachuk, A. ^{[3
]}

Yun, W. ^{[3
]}

机构：

[1] Stanford Synchrotron Radiat Lab, Menlo Pk, CA 94025 USA

[2] Inst Geophys & Planetary Phys, Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[3] Xradia Inc, Concord, CA 94520 USA

来源：

9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2009年 / 186卷

关键词：

TOMOGRAPHY;

D O I：

10.1088/1742-6596/186/1/012002

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A full-field hard-x-ray microscope at SSRL with 15 micron field of view and 40 nm resolution, as well as 3D tomographic capabilities, has successfully imaged samples of biological, environmental and astronomical origin. Spectroscopic imaging of a particle of comet dust from the NASA Stardust mission showed significantly more absorption contrast above the Fe K-edge, and tomography revealed the three-dimensional structure of the terminal particle and track through the aerogel.

引用

页数：3

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