The effect of diffusion on formation of self-assembled CdSe quantum dots

被引:6
作者
Yang, Y
Shen, DZ
Zhang, JY
Fan, XW
Zhen, ZH
Zhao, XW
Zhao, DX
Liu, YN
机构
[1] Chinese Acad Sci, Changchun Inst Opt, Lab Excited State Proc, Changchun 130021, Peoples R China
[2] Chinese Acad Sci, Changchun Inst Opt, State Key Lab Appl Opt, Changchun 130022, Peoples R China
关键词
atomic force microscopy; diffusion; low dimensional structures; metalorganic chemical vapor deposition; cadmium compounds; semiconducting II-VI materials;
D O I
10.1016/S0022-0248(01)00910-1
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The effect of diffusion on formation of self-assembled CdSe quantum dots (SAQDs) was studied in this paper. Two kinds of diffusion were observed during the growth of CdSe layer. Surface diffusion was confirmed by atomic force microscopy (AFM). Interdiffusion was verified by the photoluminescence (PL) and X-ray diffraction measurement. The surface diffusion might help to form quantum dots. However, the interdiffusion could prevent the formation of quantum dots. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:431 / 434
页数:4
相关论文
共 11 条
[1]   Near-field optical spectroscopy of localized excitons in strained CdSe quantum dots [J].
Flack, F ;
Samarth, N ;
Nikitin, V ;
Crowell, PA ;
Shi, J ;
Levy, J ;
Awschalom, DD .
PHYSICAL REVIEW B, 1996, 54 (24) :17312-17315
[2]   Growth and excitonic properties of single fractional monolayer CdSe/ZnSe structures [J].
Ivanov, SV ;
Toropov, AA ;
Shubina, TV ;
Sorokin, SV ;
Lebedev, AV ;
Sedova, IV ;
Kop'ev, PS ;
Pozina, GR ;
Bergman, JP ;
Monemar, B .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (06) :3168-3171
[3]  
KO HC, 1997, APPL PHYS LETT, V70, P3287
[4]  
Kurtz E, 1998, J CRYST GROWTH, V184, P242
[5]   Atomic force microscopy studies of ZnSe self-organized dots fabricated on ZnS/GaP [J].
Ma, ZH ;
Sun, WD ;
Sou, IK ;
Wong, GKL .
APPLIED PHYSICS LETTERS, 1998, 73 (10) :1340-1342
[6]   Self-organized growth, ripening, and optical properties of wide-bandgap II-VI quantum dots [J].
Merz, JL ;
Lee, S ;
Furdyna, JK .
JOURNAL OF CRYSTAL GROWTH, 1998, 184 :228-236
[7]  
PAMPLIN BR, 1975, CRYST GROWTH, P15
[8]   Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers [J].
Pinardi, K ;
Jain, U ;
Jain, SC ;
Maes, HE ;
Van Overstraeten, R ;
Willander, M .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (09) :4724-4733
[9]  
SCHIKIRA D, 1999, 9 INT C 2 6 COMP JAP
[10]   Nanometer scale surface clustering on ZnSe epilayers [J].
Smathers, JB ;
Kneedler, E ;
Bennett, BR ;
Jonker, BT .
APPLIED PHYSICS LETTERS, 1998, 72 (10) :1238-1240