Three-dimensional localization precision of the double-helix point spread function versus astigmatism and biplane

被引：101

作者：

Badieirostami, Majid ^{[1
]}

Lew, Matthew D. ^{[1
,2
]}

Thompson, Michael A. ^{[1
]}

Moerner, W. E. ^{[1
]}

机构：

[1] Stanford Univ, Dept Chem, Stanford, CA 94305 USA

[2] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

来源：

APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 16期

基金：

美国国家科学基金会;

关键词：

OPTICAL RECONSTRUCTION MICROSCOPY; SUPERRESOLUTION MICROSCOPY; DIFFRACTION-LIMIT; TRACKING; ACCURACY;

D O I：

10.1063/1.3499652

中图分类号：

O59 [应用物理学];

学科分类号：

070305 [高分子化学与物理];

摘要：

Wide-field microscopy with a double-helix point spread function (DH-PSF) provides three-dimensional (3D) position information beyond the optical diffraction limit. We compare the theoretical localization precision for an unbiased estimator of the DH-PSF to that for 3D localization by astigmatic and biplane imaging using Fisher information analysis including pixelation and varying levels of background. The DH-PSF results in almost constant localization precision in all three dimensions for a 2 mu m thick depth of field while astigmatism and biplane improve the axial localization precision over smaller axial ranges. For high signal-to-background ratio, the DH-PSF on average achieves better localization precision. (C) 2010 American Institute of Physics. [doi:10.1063/1.3499652]

引用

页数：3

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