Synthesis and characterization of smooth ultrananocrystalline diamond films via low pressure bias-enhanced nucleation and growth

被引:31
作者
Chen, Y. C. [1 ,2 ]
Zhong, X. Y. [6 ]
Konicek, A. R. [3 ]
Grierson, D. S. [4 ]
Tai, N. H. [2 ]
Lin, I. N. [5 ]
Kabius, B. [6 ]
Hiller, J. M. [6 ]
Sumant, A. V. [7 ]
Carpick, R. W. [8 ]
Auciello, O. [1 ,7 ]
机构
[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
[2] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
[3] Univ Wisconsin, Dept Phys, Madison, WI 53706 USA
[4] Univ Wisconsin, Dept Engn Phys, Madison, WI 53706 USA
[5] Tamkang Univ, Dept Phys, Tamsui 251, Taiwan
[6] Argonne Natl Lab, Ctr Electron Microscopy, Argonne, IL 60439 USA
[7] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA
[8] Univ Penn, Dept Mech Engn & Appl Mech, Philadelphia, PA 19104 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2838303
中图分类号
O59 [应用物理学];
学科分类号
摘要
This letter describes the fundamental process underlying the synthesis of ultrananocrystalline diamond (UNCD) films, using a new low-pressure, heat-assisted bias-enhanced nucleation (BEN)/bias enhanced growth (BEG) technique, involving H-2/CH4 gas chemistry. This growth process yields UNCD films similar to those produced by the Ar-rich/CH4 chemistries, with pure diamond nanograins (3-5 nm), but smoother surfaces (similar to 6 nm rms) and higher growth rate (similar to 1 mu m/h). Synchrotron-based x-Ray absorption spectroscopy, atomic force microscopy, and transmission electron microscopy studies on the BEN-BEG UNCD films provided information critical to understanding the nucleation and growth mechanisms, and growth condition-nanostructure-property relationships. (C) 2008 American Institute of Physics.
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页数:3
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