Identification of two patterns in magnetic force microscopy of shape memory alloys

被引：10

作者：

Neves, BRA ^{[1
]}

Andrade, MS ^{[1
]}

机构：

[1] CETEC, Lab Nanoscopia, BR-31170000 Belo Horizonte, MG, Brazil

来源：

APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 14期

关键词：

D O I：

10.1063/1.123767

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this work, we report on the observation of two coexisting patterns in magnetic force microscopy (MFM) images of shape memory alloys. The MFM signal of both patterns presents similar behavior with tip-surface separation. An investigation on the origin of these patterns presents strong evidence that both are of magnetic nature only and, furthermore, can be assigned as bulk and surface-related, respectively. (C) 1999 American Institute of Physics. [S0003-6951(99)04214-X].

引用

页码：2090 / 2092

页数：3

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