Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers

被引：61

作者：

Loppacher, C ^{[1
]}

Bammerlin, M ^{[1
]}

Battiston, F ^{[1
]}

Guggisberg, M ^{[1
]}

Muller, D ^{[1
]}

Hidber, HR ^{[1
]}

Luthi, R ^{[1
]}

Meyer, E ^{[1
]}

Guntherodt, HJ ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期

关键词：

PACS: 61.16.Ch;

D O I：

10.1007/s003390051132

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

One way to improve imaging in dynamic force microscopy is to increase the cantilever resonance frequency. Higher frequencies require faster electronics. This work presents fast new digital electronics based on the principle of phase-locked loop techniques. First results show very high frequency resolution and very stable imaging.

引用

页码：S215 / S218

页数：4

共 9 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].