Assessment of graphene quality by quantitative optical contrast analysis

被引：27

作者：

Bruna, Matteo ^{[1
]}

Borini, Stefano ^{[1
]}

机构：

[1] INRIM, Electromagnet Div, I-10135 Turin, Italy

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2009年 / 42卷 / 17期

关键词：

D O I：

10.1088/0022-3727/42/17/175307

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We show that contrast analysis carried out by standard optical microscopy can be employed as a simple and quick technique to monitor the cleanness of graphene during the process steps required for device fabrication. Graphene flakes deposited by adhesive tape exfoliation can display a strong contrast increase upon processing, due to the organic contamination arising from the diffusion of glue residues over the samples. On the other hand, graphene deposited by an adhesive-free method, such as electrostatic deposition, does not show any contrast variation, suggesting a low degree of contamination. Therefore, the fabrication process of graphene-based devices may be monitored and optimized on the basis of an easy optical inspection.

引用

页数：5

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