Energy distribution of ions bombarding biased electrodes in high density plasma reactors

被引:83
作者
Edelberg, EA
Perry, A
Benjamin, N
Aydil, ES [1 ]
机构
[1] Univ Calif Santa Barbara, Dept Chem Engn, Santa Barbara, CA 93106 USA
[2] Lam Res Corp, Fremont, CA 94538 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1999年 / 17卷 / 02期
关键词
D O I
10.1116/1.581612
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A compact retarding field ion energy analyzer has been designed and built to measure the energy distribution of ions bombarding the wafer surfaces placed on radio frequency (rf) biased electrodes in high-density plasma reactors. The analyzer was used to measure the energy distribution of ions impinging on the rf-biased electrostatic chuck in a high-density transformer coupled plasma (TCP) reactor. The effects of TCP power, rf bias, gas composition, and ion mass on the ion energy distributions (IEDs) were demonstrated through Ar, Ne, Ar/Ne, O-2 and CF4/O-2 discharges. In the operating range studied, the average ion energy increased linearly with increasing rf bias while the ion flux remained constant indicating that independent control of ion flux and energy was achieved in the TCP reactor. Bimodal ion energy distributions resulting from ion energy modulation in the sheath were observed and multiple peaks in the IEDs measured in gas mixtures were identified as ions with different masses falling through the sheath. (C) 1999 American Vacuum Society. [S0734-2101(99)03302-3].
引用
收藏
页码:506 / 516
页数:11
相关论文
共 34 条
[1]  
Aydil E. S., 1998, Materials Science in Semiconductor Processing, V1, P75, DOI 10.1016/S1369-8001(98)00003-1
[2]   ION KINETICS IN LOW-PRESSURE, ELECTROPOSITIVE, RF GLOW-DISCHARGE SHEATHS [J].
BARNES, MS ;
FORSTER, JC ;
KELLER, JH .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1991, 19 (02) :240-244
[3]  
BENIOTCATTIN P, 1969, J APPL PHYS, V39, P5723
[4]  
BOHM C, 1993, REV SCI INSTRUM, V64, P31, DOI 10.1063/1.1144398
[5]  
BOHM D, 1949, GASEOUS ELECT DISCHA, P77
[6]   ION ENERGY-DISTRIBUTION FUNCTIONS IN A MULTIPOLE CONFINED ARGON PLASMA DIFFUSING FROM A 13.56-MHZ HELICON SOURCE [J].
CHARLES, C .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (01) :157-163
[7]   POSITIVE-ION BOMBARDMENT OF SUBSTRATES IN RF DIODE GLOW-DISCHARGE SPUTTERING [J].
COBURN, JW ;
KAY, E .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (12) :4965-4971
[8]   MASS-SPECTROMETRIC STUDIES OF POSITIVE-IONS IN RF GLOW-DISCHARGES [J].
COBURN, JW .
THIN SOLID FILMS, 1989, 171 (01) :65-80
[9]   DYNAMIC-MODEL OF THE ELECTRODE SHEATHS IN SYMMETRICALLY DRIVEN RF DISCHARGES [J].
GODYAK, VA ;
STERNBERG, N .
PHYSICAL REVIEW A, 1990, 42 (04) :2299-2312
[10]   A semianalytic radio frequency sheath model integrated into a two-dimensional hybrid model for plasma processing reactors [J].
Grapperhaus, MJ ;
Kushner, MJ .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (02) :569-577