X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous GexSb40-xS60 films

被引：8

作者：

Debnath, RK ^{[1
]}

Fitzgerald, AG

Christova, K

机构：

[1] Univ Dundee, Dept Elect Engn & Phys, Carnegie Lab Phys, Dundee DD1 4HN, Scotland

[2] Bulgarian Acad Sci, Inst Solid State Phys, Sofia 178, Bulgaria

来源：

APPLIED SURFACE SCIENCE | 2002年 / 202卷 / 3-4期

基金：

英国工程与自然科学研究理事会;

关键词：

amorphous thin films; X-ray photoelectron spectroscopy; antimony; silver;

D O I：

10.1016/S0169-4332(02)00946-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-ray photoelectron spectroscopy has been used to determine the binding energies of the core electrons in Ag-doped amorphous thin GexSb40-xS60 films (x = 15. 20. 25 and 27). Chemical shifts of the constituent elements have revealed that electrons are transferred from chalcogenide to metal and compounds such as Ag2S and Ag2O are likely to form due to photoinduced chemical modification and oxidation, respectively. Charge defects are induced in the amorphous system. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：261 / 265

页数：5

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