Optical absorption and light scattering in microcrystalline silicon thin films and solar cells

被引:224
作者
Poruba, A
Fejfar, A
Remes, Z
Springer, J
Vanecek, M
Kocka, J
Meier, J
Torres, P
Shah, A
机构
[1] Acad Sci Czech Republ, Inst Phys, CZ-16253 Prague 6, Czech Republic
[2] Univ Neuchatel, Inst Microtech, CH-2000 Neuchatel, Switzerland
关键词
D O I
10.1063/1.373635
中图分类号
O59 [应用物理学];
学科分类号
摘要
Optical characterization methods were applied to a series of microcrystalline silicon thin films and solar cells deposited by the very high frequency glow discharge technique. Bulk and surface light scattering effects were analyzed. A detailed theory for evaluation of the optical absorption coefficient alpha from transmittance, reflectance and absorptance (with the help of constant photocurrent method) measurements in a broad spectral region is presented for the case of surface and bulk light scattering. The spectral dependence of alpha is interpreted in terms of defect density, disorder, crystalline/amorphous fraction and material morphology. The enhanced light absorption in microcrystalline silicon films and solar cells is mainly due to a longer optical path as the result of an efficient diffuse light scattering at the textured film surface. This light scattering effect is a key characteristic of efficient thin-film-silicon solar cells. (C) 2000 American Institute of Physics. [S0021-8979(00)07313-8].
引用
收藏
页码:148 / 160
页数:13
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