Distribution of dangling bond pairs on partially hydrogen-terminated Si(100) surface observed by scanning tunneling microscopy

被引:3
作者
Chen, RP [1 ]
Lin, DS [1 ]
机构
[1] Natl Chiao Tung Univ, Inst Phys, Hsinchu 300, Taiwan
关键词
hydrogen atom; scanning tunneling microscopy; silicon; surface electronic phenomena (work function; surface potential; surface states; etc.); surface energy; thermal desorption;
D O I
10.1016/S0039-6028(00)00199-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Hydrogen recombinative desorption from a Si2H2 monohydride dimer on the Si(100) surface regenerates a dangling bond (DB) pair on the dimer. In this paper, we investigated the spatial distribution of the regenerated DB pairs on the Si(100)-2 x 1:H and disilane-passivated Si(100) surface using elevated temperature scanning tunneling microscopy (HT-STM) in the temperature range between 590 and 622 K. Experimental results indicate that the ends of one-dimensional (1D) monohydride dimer islands are preferred sites for DB pairs and a repulsive interaction occurs between two neighboring DB pairs in the same dimer row. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:196 / 200
页数:5
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