Experimental evidence for long-range potential fluctuations in a-Se films

被引:6
作者
Emelianova, EV [1 ]
Song, HZ [1 ]
Arkhipov, VI [1 ]
Adriaenssens, GJ [1 ]
机构
[1] Katholieke Univ Leuven, Lab Halfgeleiderfys, B-3001 Heverlee, Belgium
关键词
D O I
10.1016/S0022-3093(99)00860-1
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Transient photocurrents are used to study the energy distribution of deep localized states in amorphous selenium films. The distribution of traps, as resolved from the post-transit time-of-flight photocurrent transients, reveals an apparent temperature dependence at temperatures less than 0 degrees C. However, no such temperature dependence of the trap-energy distribution was observed if this distribution is obtained from photocurrent transients measured in a gap-cell sample. We argue that this difference can be explained by the occurrence of long-range random potential fluctuations restricting access of carriers to some deep traps at lower temperatures. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:884 / 888
页数:5
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