Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB2 microcontacts

被引:2
作者
Heuberger, M
Dietler, G
Strumpler, R
Rhyner, J
Isberg, J
机构
[1] UNIV FRIBOURG, INST PHYS, CH-1700 FRIBOURG, SWITZERLAND
[2] ASEA BROWN BOVERI CORP RES, CH-5405 BADEN, SWITZERLAND
关键词
D O I
10.1063/1.365896
中图分类号
O59 [应用物理学];
学科分类号
摘要
Scanning probe microscopy was used to investigate electrical microcontacts in the nanometer range, With the atomic force microscope current flowing through the contact as well as current-voltage characteristics of the contact as a function of the force acting on the contact itself were recorded. With the scanning tunneling microscope current-voltage characteristics and voltage at constant current characteristics were measured as a function of the contact position. From these experiments we conclude that a TiB2 microcontact can sustain a maximum voltage of about 0.1-1 V before melting. These results were confirmed by a theoretical model. The implications for the functioning of so-called positive temperature coefficient current limiting devices based on filled polymers is discussed. (C) 1997 American Institute of Physics.
引用
收藏
页码:1255 / 1261
页数:7
相关论文
共 22 条
[1]   TUNNELING AND NONUNIVERSAL CONDUCTIVITY IN COMPOSITE-MATERIALS [J].
BALBERG, I .
PHYSICAL REVIEW LETTERS, 1987, 59 (12) :1305-1308
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[4]   ENERGY-DISSIPATION DURING NANOSCALE INDENTATION OF POLYMERS WITH AN ATOMIC-FORCE MICROSCOPE [J].
BOSCHUNG, E ;
HEUBERGER, M ;
DIETLER, G .
APPLIED PHYSICS LETTERS, 1994, 64 (26) :3566-3568
[5]  
DELMONTE J, 1982, METAL POLYM COPOSITE
[6]   AN INVESTIGATION OF DOPED POLYPYRROLE BY A COMBINATION OF SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPES [J].
DIETLER, G ;
HEUBERGER, M ;
TRESCH, S ;
BUJARD, P .
SYNTHETIC METALS, 1994, 67 (1-3) :211-214
[7]   OBSERVATION OF METALLIC ADHESION USING THE SCANNING TUNNELING MICROSCOPE [J].
DURIG, U ;
ZUGER, O ;
POHL, DW .
PHYSICAL REVIEW LETTERS, 1990, 65 (03) :349-352
[8]  
HOLM R, 1967, ELECTRIC CONTACTS
[9]   ELECTRICAL-RESISTIVITY OF COMPOSITES [J].
MCLACHLAN, DS ;
BLASZKIEWICZ, M ;
NEWNHAM, RE .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1990, 73 (08) :2187-2203
[10]   ELECTRICAL-CONDUCTION IN CARBON-BLACK COMPOSITES [J].
MEDALIA, AI .
RUBBER CHEMISTRY AND TECHNOLOGY, 1986, 59 (03) :432-454