From N isoelectronic impurities to N-induced bands in the GaNxAs1-x alloy

被引:175
作者
Klar, PJ [1 ]
Grüning, H
Heimbrodt, W
Koch, J
Höhnsdorf, F
Stolz, W
Vicente, PMA
Camassel, J
机构
[1] Univ Marburg, Dept Phys, D-35032 Marburg, Germany
[2] Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
[3] Univ Montpellier 2, GES, F-34095 Montpellier, France
关键词
D O I
10.1063/1.126671
中图分类号
O59 [应用物理学];
学科分类号
摘要
GaNxAs1-x samples with x<3% grown by metalorganic vapor phase epitaxy were studied by low-temperature photoluminescence under hydrostatic pressure and photomodulated reflectance spectroscopy. The transformation from N acting as an isoelectronic impurity to N-induced band formation takes place at x approximate to 0.2%. The N level does not shift with respect to the valence band edge of GaNxAs1-x. Concentration as well as hydrostatic-pressure dependence of the GaNxAs1-x bands can be described by a three band kp description of the conduction band state E- and E+ and the valence band at k = 0. The model parameters for T<20 and T = 300 K were determined by fitting the model to the experimental data. Modeling the linewidth of the E- transition by combining the kp model and ion statistics leads to the conclusion that the electron-hole pairs are strongly localized. (C) 2000 American Institute of Physics. [S0003-6951(00)02423-2].
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页码:3439 / 3441
页数:3
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