Phase transitions and ferroelectricity in very thin films: Homogeneous and inhomogeneous (domain) states

被引:14
作者
Bratkovsky, A. M.
Levanyuk, A. P.
机构
[1] Hewlett Packard Labs, Palo Alto, CA 94304 USA
[2] Univ Autonoma Madrid, Dept Fis Mat Condensada, C III, E-28049 Madrid, Spain
关键词
D O I
10.1080/10584580601077831
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We discuss ferroelectric phase transitions into single- and multidomain states in very thin films using continuous theory. We calculate a critical thickness of the homogeneous state and its stability with respect to domain formation for strained thin films of BaTiO3 on SrRuO3/SrTiO3 substrate within the Landau theory. While the former (2.5 nm) is the same as given by ab-initio calculations, the actual critical thickness is set by the domains at 1.6 nm. There is a large Merz's activation field for polarization relaxation. Remarkably, the results show a negative slope of the "actual" hysteresis loops, a hallmark of the domain structures in ideal thin films with imperfect screening. The conclusion that domains always form in thin films is valid almost irrespective of the nature of electrodes (metallic or semiconducting) and whether or not the screening carriers may be present in the ferroelectric itself. In particular, crossover from second to first order phase transition with thickness, envisaged by Batra et al. (1972), is not possible, since it is being preempted by formation of domain structure.
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页码:3 / 21
页数:19
相关论文
共 31 条
[1]   THERMODYNAMIC STABILITY OF THIN FERROELECTRIC FILMS [J].
BATRA, IP ;
SILVERMAN, BD .
SOLID STATE COMMUNICATIONS, 1972, 11 (01) :291-+
[2]   Very large dielectric response of thin ferroelectric films with the dead layers [J].
Bratkovsky, AM ;
Levanyuk, AP .
PHYSICAL REVIEW B, 2001, 63 (13)
[3]   Smearing of phase transition due to a surface effect or a bulk inhomogeneity in ferroelectric nanostructures [J].
Bratkovsky, AM ;
Levanyuk, AP .
PHYSICAL REVIEW LETTERS, 2005, 94 (10)
[4]   Abrupt appearance of the domain pattern and fatigue of thin ferroelectric films [J].
Bratkovsky, AM ;
Levanyuk, AP .
PHYSICAL REVIEW LETTERS, 2000, 84 (14) :3177-3180
[5]   Formation and rapid evolution of domain structure at phase transitions in slightly inhomogeneous ferroelectrics and ferroelastics [J].
Bratkovsky, AM ;
Levanyuk, AP .
PHYSICAL REVIEW B, 2002, 66 (18) :1-9
[6]  
BRATKOVSKY AM, CONDMAT0601484
[7]  
Chenskii E. V., 1982, Soviet Physics - JETP, V56, P618
[8]   Novel stabilization mechanism on polar surfaces: ZnO(0001)-Zn [J].
Dulub, O ;
Diebold, U ;
Kresse, G .
PHYSICAL REVIEW LETTERS, 2003, 90 (01) :4-016102
[9]   Ferroelectricity in ultrathin perovskite films [J].
Fong, DD ;
Stephenson, GB ;
Streiffer, SK ;
Eastman, JA ;
Auciello, O ;
Fuoss, PH ;
Thompson, C .
SCIENCE, 2004, 304 (5677) :1650-1653
[10]  
GURO GM, 1970, FIZ TVERD TELA+, V11, P1574