Large near resonance third order nonlinearity in GaN

被引:16
作者
Sun, CK [1 ]
Huang, YL
Liang, JC
Wang, JC
Gan, KG
Kao, FJ
Keller, S
Mack, MP
Mishra, U
Denbaars, SP
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 10617, Taiwan
[2] Natl Taiwan Univ, Grad Inst Electroopt Engn, Taipei 10617, Taiwan
[3] Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan
[4] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
关键词
GaN; nonlinear refractive index; third-order nonlinearity; two-photon absorption; two-photon confocal microscopy;
D O I
10.1023/A:1007076506723
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have studied third order nonlinearities, including two-photon absorption coefficient beta and nonlinear refractive index n(2), of GaN in below bandgap ultraviolet (UV) wavelength regime by using UV femtosecond pulses. Two-photon absorption was investigated by demonstrating femtosecond UV pulsewidth autocorrelation in a GaN thin film while femtosecond Z-scan measurements revealed information for both n(2) and beta. The distribution of n(2) versus wavelength was found to be consistent with a model described by the quadratic Stark effect, which is the dominant factor contributed to the nonlinear refractive index near the bandgap. Large beta on the order of 10 cm/GW and large negative n(2) with a magnitude on the order of several 10(-12) cm(2)/W were obtained. The beta at near mid-gap infrared (IR) wavelength was also found to be on the order of several cm/GW by using two-photon-type autocorrelations in a GaN thin film. Taking advantage of the large two-photon absorption at mid-gap wavelengths, we have demonstrated excellent image quality on two-photon confocal microscopy, including two-photon-scanning-photoluminescence imaging and two-photon optical-beam-induced current microscopy, on a GaN Hall measurement sample and an InGaN green light emitting diode.
引用
收藏
页码:619 / 640
页数:22
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