Novel nano-scale site-controlled InAs quantum dot assisted by scanning tunneling microscope probe

被引:29
作者
Nakamura, H [1 ]
Kohmoto, S [1 ]
Ishikawa, T [1 ]
Asakawa, K [1 ]
机构
[1] Femtosecond Technol Res Assoc, Tsukuba, Ibaraki 3002635, Japan
来源
PHYSICA E | 2000年 / 7卷 / 3-4期
关键词
site-control; scanning tunneling microscope; InAs quantum dot;
D O I
10.1016/S1386-9477(99)00335-5
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We propose a novel site-control technique for strained quantum dots (QDs) based on nano-lithography using an STM integrated into a UHV STM/MBE multi-chamber system. A nano-scale deposit was formed on a GaAs surface by biasing between the GaAs surface and the tungsten tip of the STM. Because the deposit acted as a nano-mask, the subsequent GaAs growth formed a nano-hole just above the deposit. Subsequent InAs supply produced a QD on the hole site, and no QD was observed in off-site regions. We discuss the physical processes involved in the technique, based on step-by-step STM observations of the QD formation process. A 100 nm-pitch array of paired 45 nm-pitch QDs was also successfully formed. This shows that the technique can be used to form a QD at any required position with nm-level precision, thus achieving the artificial nm-scale arrangement of each QD. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:331 / 336
页数:6
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