Hard X-ray nano-interferometer and its application to high-spatial-resolution phase tomography

被引:29
作者
Koyama, Takahisa [1 ]
Tsuji, Takuya [1 ]
Yoshida, Keisuke [1 ]
Takano, Hidekazu [1 ]
Tsusaka, Yoshiyuki [1 ]
Kagoshima, Yasushi [1 ]
机构
[1] Univ Hyogo, Grad Sch Med Sci, Ako, Hyogo 6781297, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2006年 / 45卷 / 42-45期
关键词
X-ray interferometer; X-ray microscopy; phase contrast; zone plate; phase retrieval; synchrotron radiation; fringe scanning method; phase tomography;
D O I
10.1143/JJAP.45.L1159
中图分类号
O59 [应用物理学];
学科分类号
摘要
A hard X-ray nano-interferometer using two types of zone plate has been developed. One is an ordinary zone plate for a microscope objective, and the other is a newly designed zone plate called an "annular zone plate" for configuring reference waves. We have succeeded in producing interference fringes with variable periods up to a fringeless pattern. The phase-shift distribution of polystyrene microparticles could be imaged clearly with a spatial resolution of 60 nm and a phase sensitivity of lambda/40 at a photon energy of 8 keV. Furthermore, this interferometer was applied to phase tomography for high-spatial-resolution three-dimensional observation.
引用
收藏
页码:L1159 / L1161
页数:3
相关论文
共 24 条
[1]  
ATTWOOD D, 1999, SOFT XRAYS EXTREME U, P303
[2]   Phase contrast X-ray tomography using synchrotron radiation [J].
Bonse, U ;
Beckmann, F ;
Bartscher, M ;
Biermann, T ;
Busch, F ;
Gunnewig, O .
DEVELOPMENTS IN X-RAY TOMOGRAPHY, 1997, 3149 :108-119
[3]   DIGITAL WAVEFRONT MEASURING INTERFEROMETER FOR TESTING OPTICAL SURFACES AND LENSES [J].
BRUNING, JH ;
HERRIOTT, DR ;
GALLAGHER, JE ;
ROSENFELD, DP ;
WHITE, AD ;
BRANGACCIO, DJ .
APPLIED OPTICS, 1974, 13 (11) :2693-2703
[4]   Quantitative phase contrast tomography using coherent synchrotron radiation [J].
Cloetens, P ;
Ludwig, W ;
Boller, E ;
Helfen, L ;
Salvo, L ;
Mache, R ;
Schlenker, M .
DEVELOPMENTS IN X-RAY TOMOGRAPHY III, 2002, 4503 :82-91
[5]   NOISE-IMMUNE PHASE UNWRAPPING ALGORITHM [J].
HUNTLEY, JM .
APPLIED OPTICS, 1989, 28 (16) :3268-3270
[6]   High-resolution hard X-ray phase-contrast microscopy with a large-diameter and high-numerical-aperture zone plate [J].
Kagoshima, Y ;
Yokoyama, Y ;
Ibuki, T ;
Niimi, T ;
Tsusaka, Y ;
Takai, K ;
Matsui, J .
JOURNAL OF SYNCHROTRON RADIATION, 2002, 9 :132-135
[7]   10 keV X-ray phase-contrast microscopy for observing transparent specimens [J].
Kagoshima, Y ;
Ibuki, T ;
Yokoyama, Y ;
Tsusaka, Y ;
Matsui, J ;
Takai, K ;
Aino, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2001, 40 (11A) :L1190-L1192
[8]  
Kinoshita K., 1992, Proceedings of the SPIE - The International Society for Optical Engineering, V1741, P287
[9]   Phase tomography using diffraction-enhanced imaging [J].
Koyama, I ;
Hamaishi, Y ;
Momose, A .
SYNCHROTRON RADIATION INSTRUMENTATION, 2004, 705 :1283-1286
[10]   High-spatial-resolution phase measurement by micro-interferometry using a hard X-ray imaging microscope [J].
Koyama, T ;
Kagoshima, Y ;
Wada, I ;
Saikubo, A ;
Shimose, K ;
Hayashi, K ;
Tsusaka, Y ;
Matsui, J .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2004, 43 (3B) :L421-L423