学术探索
学术期刊
新闻热点
数据分析
智能评审

Scanning probe microscopy

被引：39
作者：
Lillehei, PT [1 ]
Bottomley, LA [1 ]
机构：
[1] Georgia Inst Technol, Sch Chem & Biochem, Atlanta, GA 30332 USA
来源：
ANALYTICAL CHEMISTRY | 2000年 / 72卷 / 12期
关键词：
D O I：
10.1021/a10000108
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
[No abstract available]
引用
收藏
页码：189R / 196R
页数：8
相关论文
共 132 条
  • [1] The application of force microscopy to immunodiagnostic systems imaging and biomolecular adhesion measurements
    Allen, S
    Chen, X
    Davies, J
    Davies, MC
    Dawkes, AC
    Edwards, JC
    Roberts, CJ
    Tendler, SJB
    Williams, PM
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S255 - S261
  • [2] The influence of epitope availability on atomic-force microscope studies of antigen-antibody interactions
    Allen, S
    Davies, J
    Davies, MC
    Dawkes, AC
    Roberts, CJ
    Tendler, SJB
    Williams, PM
    [J]. BIOCHEMICAL JOURNAL, 1999, 341 : 173 - 178
  • [3] How to measure energy dissipation in dynamic mode atomic force microscopy
    Anczykowski, B
    Gotsmann, B
    Fuchs, H
    Cleveland, JP
    Elings, VB
    [J]. APPLIED SURFACE SCIENCE, 1999, 140 (3-4) : 376 - 382
  • [4] Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation
    Anczykowski, B
    Cleveland, JP
    Kruger, D
    Elings, V
    Fuchs, H
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S885 - S889
  • [5] Dynamic surface force measurement. I. van der Waals collisions
    Attard, P
    Schulz, JC
    Rutland, MW
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (11) : 3852 - 3866
  • [6] Dynamic surface force measurement. 2. Friction and the atomic force microscope
    Attard, P
    Carambassis, A
    Rutland, MW
    [J]. LANGMUIR, 1999, 15 (02) : 553 - 563
  • [7] Carbon nanotubes: nanomechanics, manipulation, and electronic devices
    Avouris, P
    Hertel, T
    Martel, R
    Schmidt, T
    Shea, HR
    Walkup, RE
    [J]. APPLIED SURFACE SCIENCE, 1999, 141 (3-4) : 201 - 209
  • [8] Effect of viscoelastic properties of polymers on the phase shift in tapping mode atomic force microscopy
    Bar, G
    Brandsch, R
    Whangbo, MH
    [J]. LANGMUIR, 1998, 14 (26) : 7343 - 7348
  • [9] Effect of tip sharpness on the relative contributions of attractive and repulsive forces in the phase imaging of tapping mode atomic force microscopy
    Bar, G
    Brandsch, R
    Whangbo, MH
    [J]. SURFACE SCIENCE, 1999, 422 (1-3) : L192 - L199
  • [10] Description of the frequency dependence of the amplitude and phase angle of a silicon cantilever tapping on a silicon substrate by the harmonic approximation
    Bar, G
    Brandsch, R
    Whangbo, MH
    [J]. SURFACE SCIENCE, 1998, 411 (1-2) : L802 - L809
12345678910