High resolution electron microscopy of zeolites

被引：28

作者：

Pan, M ^{[1
]}

机构：

[1] ARIZONA STATE UNIV, CTR SOLID STATE SCI, TEMPE, AZ 85287 USA

来源：

MICRON | 1996年 / 27卷 / 3-4期

关键词：

HREM; low-dose; slow-scan CCD camera; radiation damage; projected potential maps; digital diffractogram; quantitative image analysis; real-space averaging; online image acquisition; online image evaluation; structural determination; zeolites; ZSM-5; beta; FAU; EMT; ABC-6; SSZ-26; SSZ-33; offretite; sodalite; erionite; tschernichite; intergrowth; stacking faults; 2D 3-connected net; faults;

D O I：

10.1016/0968-4328(96)84210-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

This article reviews the application of high resolution electron microscopy techniques to zeolite structural characterization. Examples given in this article include identification of structural intergrowth, stacking faults and framework projection net from high resolution images. Slow-scan CCD (charge-coupled device) cameras, representing the latest advance in electron microscopy instrumentation, are briefly introduced. Low-dose, high resolution electron microscopy using commercial CCD cameras is discussed. With slow-scan CCD cameras, it is shown that it is possible to directly read off the underlying zeolite structures from experimental high resolution images when suitable image processing techniques are employed. This latest advance greatly enhances the power of high resolution electron microscopy techniques in solving unknown zeolite structures. Copyright (C) 1996 Elsevier Science Ltd.

引用

页码：219 / 238

页数：20

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