A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopy

被引：36

作者：

Piétrement, O ^{[1
]}

Beaudoin, JL ^{[1
]}

Troyon, M ^{[1
]}

机构：

[1] Univ Reims, Unite Therm & Anal Phys, F-51685 Reims 2, France

来源：

TRIBOLOGY LETTERS | 1999年 / 7卷 / 04期

关键词：

scanning force microscopy; lateral force modulation; contact stiffness; elasticity; friction;

D O I：

10.1023/A:1019150226828

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

We describe a new calibration method for lateral contact stiffness using modulated lateral force microscopy, a technique that offers some advantages with respect to the more classical friction force microscopy currently used for characterizing the friction properties of materials. The calibration method is based on the study of the lateral contact stiffness versus applied load and on the use of elasticity contact theories to determine by fit the calibration coefficient, allowing the scaling of experimental data. The method is tested by measuring the friction coefficient and shear strength of silicon and mica samples, respectively, and compared with results from the literature.

引用

页码：213 / 220

页数：8

共 31 条

[1] MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].

ALBRECHT, TR ;

AKAMINE, S ;

CARVER, TE ;

QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396

[2] Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy [J].

Bhushan, B ;

Sundararajan, S .

ACTA MATERIALIA, 1998, 46 (11) :3793-3804

[3]

BHUSHAN B, 1997, NATO ASI SERIES E, V330

[4]

Bowden FP, 2001, Friction and Lubrication of Solids

[5] Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy [J].

Carpick, RW ;

Ogletree, DF ;

Salmeron, M .

APPLIED PHYSICS LETTERS, 1997, 70 (12) :1548-1550

[6]

Colchero J, 1996, APPL PHYS LETT, V68, P2896, DOI 10.1063/1.116324

[7] Optical detection for scanning microdeformation microscopy [J].

Cretin, B ;

Vairac, P .

APPLIED PHYSICS LETTERS, 1997, 71 (15) :2082-2084

[8] EFFECT OF CONTACT DEFORMATIONS ON ADHESION OF PARTICLES [J].

DERJAGUIN, BV ;

MULLER, VM ;

TOPOROV, YP .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1975, 53 (02) :314-326

[9] Determination of the spring constants of probes for force microscopy/spectroscopy [J].

Gibson, CT ;

Watson, GS ;

Myhra, S .

NANOTECHNOLOGY, 1996, 7 (03) :259-262

[10] A LATERAL MODULATION TECHNIQUE FOR SIMULTANEOUS FRICTION AND TOPOGRAPHY MEASUREMENTS WITH THE ATOMIC-FORCE MICROSCOPE [J].

GODDENHENRICH, T ;

MULLER, S ;

HEIDEN, C .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (09) :2870-2873

← 1 2 3 4 →