Fabrication of three-dimensional microstructures using standard ultraviolet and electron-beam lithography

被引:31
作者
Galas, JC
Belier, B
Aassime, A
Palomo, J
Bouville, D
Aubert, J
机构
[1] Univ Paris 11, IEF, UMR 8622, Ctr Orsay, F-91405 Orsay, France
[2] CNRS, LPN, F-91460 Marcoussis, France
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2004年 / 22卷 / 03期
关键词
D O I
10.1116/1.1755213
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have designed and fabricated shape-controlled three-dimensional structures combining electron-beam and ultraviolet (UV) lithography. Starting with a tiff file format, a gray scale pattern using a high energy beam sensitive mask is produced with electron-beam direct writing. In only a one step UV exposure, an optical lens and a photonic band gap structure in 16.5 mum thick AZ 4562 positive photoresist, with controlled profile and smooth resist surface, were fabricated. A three-dimensional grid structure was also transferred to a 100 mum thick SU-8 negative photoresist. (C) 2004 American Vacuum Society.
引用
收藏
页码:1160 / 1162
页数:3
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