Evidence for a strain-induced variation of the magnetic moment in epitaxial Cu/Ni/Cu/Si(100) structures

被引：43

作者：

Lee, J

Lauhoff, G

Tselepi, M

Hope, S

Rosenbusch, P

Bland, JAC

Durr, HA

vanderLaan, G

Schille, JP

Matthew, JAD

机构：

[1] SERC,DARESBURY LAB,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND

[2] UNIV YORK,DEPT PHYS,YORK YO1 5DD,N YORKSHIRE,ENGLAND

来源：

PHYSICAL REVIEW B | 1997年 / 55卷 / 22期

关键词：

D O I：

10.1103/PhysRevB.55.15103

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have studied the magnetic moment and in-plane strain in epitaxial Cu/Ni/Cu/Si(100) structures by varying both the Ni and Cu buffer layer thickness. We find a sharp reduction in magnetic moment with increasing Ni lattice strain. Our structural and temperature-dependent studies exclude interdiffusion, interface roughness, and a decreased Curie temperature as possible causes of the reduced moment, but reveal a strong correlation between the strain and magnetic moment in Cu/Ni/Cu structures.

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页码：15103 / 15107

页数：5

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