Photoelectron emission in femtosecond laser assisted scanning tunneling microscopy

被引：26

作者：

Pfeiffer, W ^{[1
]}

Sattler, F ^{[1
]}

Vogler, S ^{[1
]}

Gerber, G ^{[1
]}

Grand, JY ^{[1
]}

Moller, R ^{[1
]}

机构：

[1] UNIV STUTTGART,INST PHYS,D-70550 STUTTGART,GERMANY

来源：

APPLIED PHYSICS B-LASERS AND OPTICS | 1997年 / 64卷 / 02期

关键词：

D O I：

10.1007/s003400050173

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Direct illumination of the tunneling gap in an ultrahigh vacuum scanning tunneling microscope with ultrashort pump-probe laser pulses may offer ultimate spatial and temporal resolution in surface experiments. The electronic bandwidth of the tunneling gap (< 1 THz) does not limit the time resolution. Our experiments show that multiphoton photoelectron emission from the sample limits the application of this detection scheme at high laser fluence. However, a substrate specific pump-probe effect in the photoelectron yield with femtosecond transients is observed on Tantalum and on GaAs(110) surfaces.

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页码：265 / 268

页数：4

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