A simple optical emission method for measuring percent dissociations of feed gases in plasmas: Application to Cl-2 in a high-density helical resonator plasma

被引:82
作者
Donnelly, VM
机构
[1] Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1996年 / 14卷 / 03期
关键词
D O I
10.1116/1.580137
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Optical emission was used to determine absolute Cl-2 number densities in a Cl-2 high-density, helical resonator plasma that was used to etch Si. Emission from Cl-2 at 306 nm was monitored, and rare-gas actinometry was used to correct for changes in the electron energy distribution. This emission band of Cl-2 is ascribed in this study to a state at 8.4 eV, or possibly to one at 9.2 eV. A state of Xe at 9.8 eV, emitting at 823.2 nm, was chosen as a suitable match to the energy of the emitting state of Cl-2. Absolute number density measurements were obtained by extending the measurement to extremely low powers where little dissociation occurs. This simple self-calibration method has advantages over other more complicated techniques such as laser induced fluorescence that rely on external calibrations. It is also much easier to carry out than mass spectrometry and is more sensitive than optical absorption. It is applicable to feed gases with optical emission from states with energies above about 8 eV In this study it was found that a Cl-2 helical resonator discharge is nearly completely dissociated (95%) at a power density of 0.4 W/cm(3) in the glass tube source region. The percent dissociation drops to 85% below the source and above the Si substrate. Near the stainless-steel walls, fast Cl-atom recombination reduces the dissociation to similar to 10% (determined by line-of-sight mass spectrometry). The high degree of dissociation in the source and near-downstream region is in agreement with recent model predictions for high-density discharges. (C) 1996 American Vacuum Society.
引用
收藏
页码:1076 / 1087
页数:12
相关论文
共 43 条
[1]  
ANDERSON H, COMMUNICATION
[2]   THEORETICAL AND EXPERIMENTAL INVESTIGATIONS OF CHLORINE RF GLOW-DISCHARGES .2. EXPERIMENTAL [J].
AYDIL, ES ;
ECONOMOU, DJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (05) :1406-1412
[3]   THEORETICAL AND EXPERIMENTAL INVESTIGATIONS OF CHLORINE RF GLOW-DISCHARGES .1. THEORETICAL [J].
AYDIL, ES ;
ECONOMOU, DJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (05) :1396-1406
[4]   THERMAL TRANSPIRATION - APPLICATION OF LIANGS EQUATION [J].
BENNETT, MJ ;
TOMPKINS, FC .
TRANSACTIONS OF THE FARADAY SOCIETY, 1957, 53 (02) :185-192
[5]  
BUKOWSKI JD, 1995, 42 NAT S AM VAC SOC
[6]   POTENTIAL HIGH-EFFICIENCY CL2 ULTRAVIOLET LASER [J].
CHEN, CH ;
PAYNE, MG .
APPLIED PHYSICS LETTERS, 1976, 28 (04) :219-221
[7]   IN-SITU PULSED LASER-INDUCED THERMAL-DESORPTION STUDIES OF THE SILICON CHLORIDE SURFACE-LAYER DURING SILICON ETCHING IN HIGH-DENSITY PLASMAS OF CL2 AND CL2/O2 MIXTURES [J].
CHENG, CC ;
GUINN, KV ;
DONNELLY, VM ;
HERMAN, IP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (05) :2630-2640
[8]   COMPETITIVE HALOGENATION OF SILICON SURFACES IN HBR/CL-2 PLASMAS STUDIED RAY PHOTOELECTRON-SPECTROSCOPY AND IN-SITU, REAL-TIME, PULSED LASER-INDUCED THERMAL-DESORPTION [J].
CHENG, CC ;
GUINN, KV ;
HERMAN, IP ;
DONNELLY, VM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (04) :1970-1976
[9]   OPTICAL-EMISSION SPECTROSCOPY OF REACTIVE PLASMAS - A METHOD FOR CORRELATING EMISSION INTENSITIES TO REACTIVE PARTICLE DENSITY [J].
COBURN, JW ;
CHEN, M .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (06) :3134-3136
[10]   REACTION OF ATOMIC AND MOLECULAR CHLORINE WITH ALUMINUM [J].
DANNER, DA ;
HESS, DW .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (03) :940-947