OPTICAL-EMISSION SPECTROSCOPY OF REACTIVE PLASMAS - A METHOD FOR CORRELATING EMISSION INTENSITIES TO REACTIVE PARTICLE DENSITY

被引:866
作者
COBURN, JW
CHEN, M
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10.1063/1.328060
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O59 [应用物理学];
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页码:3134 / 3136
页数:3
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共 8 条
[1]   PLASMA-ETCHING - DISCUSSION OF MECHANISMS [J].
COBURN, JW ;
WINTERS, HF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :391-403
[2]   END-POINT DETERMINATION OF ALUMINUM CCL4 PLASMA ETCHING BY OPTICAL EMISSION-SPECTROSCOPY [J].
CURTIS, BJ ;
BRUNNER, HJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (05) :829-830
[3]   STUDY OF OPTICAL EMISSION FROM AN RF PLASMA DURING SEMICONDUCTOR ETCHING [J].
HARSHBARGER, WR ;
PORTER, RA ;
MILLER, TA ;
NORTON, P .
APPLIED SPECTROSCOPY, 1977, 31 (03) :201-207
[4]   OPTICAL DETECTOR TO MONITOR PLASMA ETCHING [J].
HARSHBARGER, WR ;
PORTER, RA ;
NORTON, P .
JOURNAL OF ELECTRONIC MATERIALS, 1978, 7 (03) :429-440
[5]   PLASMA ETCHING OF SI AND SIO2 - EFFECT OF OXYGEN ADDITIONS TO CF4 PLASMAS [J].
MOGAB, CJ ;
ADAMS, AC ;
FLAMM, DL .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (07) :3796-3803
[6]  
MOGAB CJ, 1977, J ELECTROCHEM SOC, V124, P1262, DOI 10.1149/1.2133542
[7]   PLASMA ETCHING IN INTEGRATED-CIRCUIT MANUFACTURE - REVIEW [J].
POULSEN, RG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (01) :266-274
[8]  
WINTERS H, UNPUBLISHED