Reliability and degradation of small molecule-based organic light-emitting devices (OLEDs)

被引:113
作者
Popovic, ZD [1 ]
Aziz, H [1 ]
机构
[1] Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2L1, Canada
关键词
aging; AlQ(3); degradation; OLED; organic light-emitting devices; reliability; stability;
D O I
10.1109/2944.999191
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Studies of degradation mechanisms in small molecule-based organic light-emitting devices (OLEDs) are reviewed. A special emphasis is given to OLEDs based on tris (8-hydroxyquinoline) aluminum (AlQ(3)), an emitter and electron transport material used in the majority of OLEDs emitting from the green to the red part of the spectrum. Different strategies used for increasing device stability are addressed and the models proposed to explain experimental observations related to OLED operational stability are discussed. Although none of the presently proposed models can explain all experimental observations, the largest body of experimental evidence appears to be consistent with a model based on the instability of cationic AlQ(3) species, produced by the injection of holes into the AlQ(3) electron transport and emitter layer. Other models may be of importance in explaining degradation behavior on different time scales. Models based on redistribution of space charge appear to be responsible for reversible short-term degradation, while a model based on indium migration may be important for degradation on very long time scales.
引用
收藏
页码:362 / 371
页数:10
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