Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals

被引：26

作者：

Hilfiker, JN

Johs, B

Herzinger, CM

Elman, JF

Montbach, E

Bryant, D

Bos, PJ

机构：

[1] JA Woollam Co Inc, Lincoln, NE 68508 USA

[2] Eastman Kodak Co, Kodak Res Labs, Imaging Mat Div, Rochester, NY 14650 USA

[3] Kent State Univ, Liquid Crystal Inst, Kent, OH 44242 USA

来源：

THIN SOLID FILMS | 2004年 / 455卷

关键词：

generalized spectroscopic ellipsometry; Mueller-matrix; anisotropic materials; liquid crystals;

D O I：

10.1016/j.tsf.2004.01.031

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Generalized spectroscopic ellipsometry (g-SE) and Mueller-matrix (MM) measurements are applied to twisted nematic (TN) and super twisted nematic (STN) displays. Transmitted measurements near normal incidence are used to extract twist, phi(d), and anisotropy for each display type. Angle-dependent measurements are used to determine tilt distribution, phi(d). Oblique angle measurements allow characterization of both ordinary and extraordinary indices. Finally, the liquid crystal layer thickness is accurately determined from coherent interference oscillations. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：596 / 600

页数：5

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