Heteroepitaxal fabrication and structural characterizations of ultrafine GaN/ZnO coaxial nanorod heterostructures

被引:57
作者
An, SJ
Park, WI
Yi, GC [1 ]
Kim, YJ
Kang, HB
Kim, M
机构
[1] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea
[2] LG Siltron Adv Mat Res Ctr, Gumi 730724, Kyoungbuk, South Korea
[3] Samsung Adv Inst Technol, Suwon 440600, South Korea
关键词
D O I
10.1063/1.1738180
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on heteroepitaxial fabrication and structural characterizations of ultrafine GaN/ZnO coaxial nanorod heterostructures. The coaxial nanorod heterostructures were fabricated by epitaxial growth of a GaN layer on ultrafine ZnO nanorods. Epitaxial growth and precise control of GaN overlayer thickness were obtained by low pressure metalorganic vapor-phase epitaxy. ZnO nanorods grown on Si and sapphire substrates using catalyst-free metalorganic chemical vapor deposition exhibited diameters as small as 7 nm. Furthermore, structural properties of the coaxial nanorod heterostructures were investigated using both synchrotron-radiation x-ray diffraction and high resolution transmission electron microscopy. (C) 2004 American Institute of Physics.
引用
收藏
页码:3612 / 3614
页数:3
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