A vertical inertial coarse approach for variable temperature scanned probe microscopy

被引：12

作者：

Silveira, WR ^{[1
]}

Marohn, JA ^{[1
]}

机构：

[1] Cornell Univ, Dept Chem & Chem Biol, Ithaca, NY 14853 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 01期

关键词：

D O I：

10.1063/1.1524712

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have developed a variable temperature inertial coarse approach mechanism for use in scanned probe microscopy. This reliable micropositioner has a coarse range of 2.5 mm and can take individual steps of less than 10 nm from 4 to 300 K. This simple, compact device is both nonmagnetic and glueless. It is operational in both horizontal and vertical geometries and is driven by a low voltage sawtooth waveform. We report on the design and performance of the device. (C) 2003 American Institute of Physics.

引用

页码：267 / 269

页数：3

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