Analysis of the stretched exponential photoluminescence decay from nanometer-sized silicon crystals in SiO2

Time resolved photoluminescence (PL) decays have been measured for Si nanocrystals embedded in silicon dioxide. The nanocrystals were formed by implanting 40 keV Si ions into a 1000 Angstrom thick film of thermally grown SiO2, followed by thermal annealing at 1000-1200 degrees C. The observed luminescence, peaking at 700-850 nm, is compared to similar measurements performed on porous Si emitting in the same wavelength range. The results show that the PL from the nanocrystals exhibits a stretched exponential decay with characteristic decay time tau in the range 10-150 mu s and dispersion factor beta in the range 0.7-0.8. Both parameters are, however, higher for the nanocrystals compared to those of porous Si indicating superior passivation of the nanocrystals in the SiO2 matrix. Evidence is also presented for a single exponential behavior at the decay end suggesting a remaining fraction of excitons in isolated nanocrystals. We attribute the highly nonlinear dose dependence of the PL yield to a nucleation process for the nanocrystals and a more curved decay line shape for higher ion doses to a higher crystal density, promoting excitonic migration to nearby nanocrystals. These observations provide strong evidence that the origin of the stretched exponential line shape of the PL decay results from migration and trapping of excitons in a system of randomly distributed and interconnected nanocrystals with a dispersion in size. (C) 1999 American Institute of Physics. [S0021-8979(99)04623-X].