DC and RF characteristics of 0.7-μm-gate-length diamond metal-insulator-semiconductor field effect transistor

被引:21
作者
Ishizaka, H
Umezawa, H
Taniuchi, H
Arima, T
Fujihara, N
Tachiki, M
Kawarada, H
机构
[1] Waseda Univ, Sch Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan
[2] CREST, JST, Tokyo 1020081, Japan
关键词
diamond; current decrease; MISFET; cut-off frequency;
D O I
10.1016/S0925-9635(01)00649-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A 0.7-mum-gate-length metal-insulator-semiconductor field effect transistor (MISFET) was fabricated on a hydrogen-terminated diamond surface conductive layer. The maximum transconductance of 100 mS/mm was obtained by DC measurement. The cutoff frequency of 11 GRz and the maximum frequency of oscillation of 18 GHz were achieved for the fabricated MISFET biased at V-GS = 0 V and V-DS = -12 V. These are the highest values for diamond MISFETs ever reported. In the MISFET, high-frequency small-signal equivalent circuit analysis is carried out at V-GS = 0 V and V-DS = -3, -5, -8, -10 and -12 V The analysis indicates that the reduction of parasitic resistance between the source and gate is necessary for realizing higher output power. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:378 / 381
页数:4
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