Scattering times in AlGaN/GaN two-dimensional electron gas from magnetoresistance measurements

被引:52
作者
Braña, AF [1 ]
Diaz-Paniagua, C
Batallan, F
Garrido, JA
Muñoz, E
Omnes, F
机构
[1] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain
[2] Univ Politecn Madrid, Escuela Tecn Super Ingn Telecomun, Dept Ingn Elect, E-28040 Madrid, Spain
[3] CNRS, CRHEA, F-06560 Valbonne, France
关键词
D O I
10.1063/1.373758
中图分类号
O59 [应用物理学];
学科分类号
摘要
The diagonal and nondiagonal components of the transverse magnetoresistance have been measured, over a wide magnetic field range, in modulated doped Al0.25Ga0.75N/GaN heterostructures. The diagonal component shows electron-electron interaction in the whole magnetic field range, Shubnikov-de Hass (SdH) oscillations superimposed at high magnetic field, and weak localization at very low magnetic field. The SdH oscillations are evidence of the existence of a two-dimensional electron gas (2DEG) in the heterostructure. Only one kind of carriers is present with an electron density of 1.01 x 10(17) m(-2), an effective mass of 0.23m(0) and a quantum scattering time tau(q) = 0.05 ps. From the diffusive electron-electron interaction, an impurity scattering time tau(ee) = 0.044 ps, a Hartree factor F = 0.25 and the Drude scattering time tau(0) = 0.26 ps, were obtained. The weak localization yields two scattering times, an elastic scattering time tau(e) = 0.023 ps independent of the temperature, and an inelastic scattering time, tau(i), with a temperature dependence following the 1/tau(i) proportional to T ln T law expected for the impurity contribution of the electron-electron interaction in 2D. The tau(q)/tau(0) ratio gives the dominant scattering mechanism, which in our case is 0.19. The remote ionized impurities alone do not explain this obtained ratio, while the introduction of the interface roughness could explain it. (C) 2000 American Institute of Physics. [S0021-8979(00)06314-3].
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页码:932 / 937
页数:6
相关论文
共 31 条
[1]   QUASIPARTICLE LIFETIME IN DISORDERED TWO-DIMENSIONAL METALS [J].
ABRAHAMS, E ;
ANDERSON, PW ;
LEE, PA ;
RAMAKRISHNAN, TV .
PHYSICAL REVIEW B, 1981, 24 (12) :6783-6789
[2]   Transport coefficients of AlGaN/GaN heterostructures [J].
Ahoujja, M ;
Mitchel, WC ;
Elhamri, S ;
Newrock, RS ;
Mast, DB ;
Redwing, JM ;
Tischler, MA ;
Flynn, JS .
JOURNAL OF ELECTRONIC MATERIALS, 1998, 27 (04) :210-214
[4]   WEAK LOCALIZATION IN THIN-FILMS - A TIME-OF-FLIGHT EXPERIMENT WITH CONDUCTION ELECTRONS [J].
BERGMANN, G .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1984, 107 (01) :1-58
[5]  
Burgt M V D, 1995, PHYS REV B, V52, P12218, DOI [10.1103/PhysRevB.52.12218, DOI 10.1103/PHYSREVB.52.12218]
[6]   Influence of potential fluctuations on electrical transport and optical properties in modulation-doped GaN/Al0.28Ga0.72N heterostructures [J].
Buyanov, AV ;
Bergman, JP ;
Sandberg, JA ;
Sernelius, BE ;
Holtz, PO ;
Monemar, B ;
Amano, H ;
Akasaki, I .
PHYSICAL REVIEW B, 1998, 58 (03) :1442-1450
[7]   WEAK LOCALIZATION - THE QUASI-CLASSICAL THEORY OF ELECTRONS IN A RANDOM POTENTIAL [J].
CHAKRAVARTY, S ;
SCHMID, A .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1986, 140 (04) :193-236
[8]   DEPHASING TIME AND ONE-DIMENSIONAL LOCALIZATION OF TWO-DIMENSIONAL ELECTRONS IN GAAS/ALXGA1-XAS HETEROSTRUCTURES [J].
CHOI, KK ;
TSUI, DC ;
ALAVI, K .
PHYSICAL REVIEW B, 1987, 36 (14) :7751-7754
[9]   ELECTRON-ELECTRON INTERACTIONS IN GAAS-ALXGA1-XAS HETEROSTRUCTURES [J].
CHOI, KK ;
TSUI, DC ;
PALMATEER, SC .
PHYSICAL REVIEW B, 1986, 33 (12) :8216-8227
[10]   Comparison of N-face and Ga-face AlGaN/GaN-based high electron mobility transistors grown by plasma-induced molecular beam epitaxy [J].
Dimitrov, R ;
Mitchell, A ;
Wittmer, L ;
Ambacher, O ;
Stutzmann, M ;
Hilsenbeck, J ;
Rieger, W .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (9A) :4962-4968