Nonswitching laver model for voltage shift phenomena in heteroepitaxial barium titanate thin films

被引:31
作者
Abe, K [1 ]
Yanase, N [1 ]
Yasumoto, T [1 ]
Kawakubo, T [1 ]
机构
[1] Toshiba Co Ltd, Ctr Corp Res & Dev, Adv Discrete Semicond Technol Lab, Saiwai Ku, Kawasaki, Kanagawa 2128582, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 10期
关键词
BaTiO3; barium titanate; thin film capacitor; ferroelectricity; hysteresis loop; voltage shift; epitaxial growth; lattice misfit;
D O I
10.1143/JJAP.41.6065
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have introduced a nonswitching layer model to explain voltage shift phenomena of hysteresis loops in a heteroepitaxial barium titanate thin film capacitor. A nonswitching layer. which has irreversible spontaneous polarization, was assumed to be present between the ferroelectric layer and the bottom electrode layer. Calculation based on the model demonstrated that the presence of the nonswitching layer would cause an inherent voltage shift of the hysteresis loop from the origin along the voltage axis. If free charges accumulate at the interface between the ferroelectric layer and the nons itching layer to compensate the discontinuity of the polarization. the hysteresis loop would inversely move toward the opposite direction. A series of experimental results observed for a c-axis oriented barium titanate thin film seemed consistent with the model. It was suggested that the nonswitching layer may be formed in accordance with relaxation of lattice misfit stress in the early stage of the heteroepitaxial growth.
引用
收藏
页码:6065 / 6071
页数:7
相关论文
共 20 条
[1]   Asymmetric ferroelectricity and anomalous current conduction in heteroepitaxial BaTiO3 thin films [J].
Abe, K ;
Komatsu, S ;
Yanase, N ;
Sano, K ;
Kawakubo, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (9B) :5846-5853
[2]   Voltage shift phenomena in a heteroepitaxial BaTiO3 thin film capacitor [J].
Abe, K ;
Yanase, N ;
Yasumoto, T ;
Kawakubo, T .
JOURNAL OF APPLIED PHYSICS, 2002, 91 (01) :323-330
[3]   FERROELECTRIC PROPERTIES IN EPITAXIALLY GROWN BAXSR1-XTIO3 THIN-FILMS [J].
ABE, K ;
KOMATSU, S .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (12) :6461-6465
[4]   Bistable states of ferroelectric hysteresis loops in a heteroepitaxial BaTiO3 thin film capacitor [J].
Abe, K ;
Yanase, N ;
Kawakubo, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (4A) :2367-2371
[5]   Uniformity of misfit strain in heteroepitaxial (Ba,Sr)TiO3 films on SrRuO3/SrTiO3 [J].
Abe, K ;
Yanase, N ;
Sano, K ;
Fukushima, N ;
Kawakubo, T .
MULTICOMPONENT OXIDE FILMS FOR ELECTRONICS, 1999, 574 :3-10
[6]   Phenomenologically derived electric field-temperature phase diagrams and piezoelectric coefficients for single crystal barium titanate under fields along different axes [J].
Bell, AJ .
JOURNAL OF APPLIED PHYSICS, 2001, 89 (07) :3907-3914
[7]  
DEVONSHIRE AF, 1949, PHILOS MAG, V40, P1040
[8]   Single-crystal Pb(ZrxTi1-x)O-3 thin films prepared by metal-organic chemical vapor deposition: Systematic compositional variation of electronic and optical properties [J].
Foster, CM ;
Bai, GR ;
Csencsits, R ;
Vetrone, J ;
Jammy, R ;
Wills, LA ;
Carr, E ;
Amano, J .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (05) :2349-2357
[9]   CURRENT-VOLTAGE CHARACTERISTICS OF ELECTRON-CYCLOTRON-RESONANCE SPUTTER-DEPOSITED SRTIO3 THIN-FILMS [J].
FUKUDA, Y ;
AOKI, K ;
NUMATA, K ;
NISHIMURA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9B) :5255-5258
[10]   Thickness transitions of ferroelectricity in thin films [J].
Ishibashi, Y ;
Orihara, H ;
Tilley, DR .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1998, 67 (09) :3292-3297