Micro-Raman spectroscopy of the solid state: applications to semiconductors and thin films

被引：30

作者：

Jawhari, T ^{[1
]}

机构：

[1] Univ Barcelona, Serv Cientif Tecn, E-08028 Barcelona, Spain

来源：

ANALUSIS | 2000年 / 28卷 / 01期

关键词：

D O I：

10.1051/analusis:2000280015

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The potential of Raman microspectroscopy as a powerful tool in characterizing solids will be demonstrated here with several applications on semiconductors and thin films. The method not only permits the identification of different localized microscopic regions, with a high spatial resolution and with no sample preparation, but also provides several basic information on the microstructure of solids.

引用

收藏

页码：15 / 22

页数：8

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