Amorphous silicon solar cells deposited at high growth rate

被引:79
作者
Nishimoto, T
Takai, M
Miyahara, H
Kondo, M
Matsuda, A
机构
[1] Canon Ecol R&D Ctr, Dept E11, Kyoto 6190281, Japan
[2] Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
[3] Natl Inst Adv Ind Sci & Technol, Res Initiat Thin Film Silicon Solar Cells, Tsukuba, Ibaraki 3058568, Japan
关键词
D O I
10.1016/S0022-3093(02)00942-0
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A series of investigations was performed to improve stabilized efficiency of hydrogenated amorphous silicon (a-Si:H) solar cells deposited at a high growth rate of 15-20 A/s by the plasma-enhanced chemical vapor deposition method. The deterioration of film stability accompanied by an increase of deposition rate was found to be closely correlated with the increase of Si-H, bond hydrogen content in the deposited film. Plasma diagnosis results by quadrupole mass spectrometry and optical emission spectroscopy showed that reduction of electron temperature of plasma can effectively suppress the formation of higher-order silane-related species in the plasma and can improve film stability. According to the guiding principles deduced from the plasma diagnosis, we successfully improved the stability of cell performance and obtained a considerably improved stabilized efficiency of 8.2% at a high rate of 20 Angstrom/s. Key issues for improving stabilized efficiency of high growth-rate a-Si:H solar cells. by making the best use of plasma diagnostic techniques, are presented and discussed. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1116 / 1122
页数:7
相关论文
共 13 条
[1]   Structural, defect, and device behavior of hydrogenated amorphous Si near and above the onset of microcrystallinity [J].
Guha, S ;
Yang, J ;
Williamson, DL ;
Lubianiker, Y ;
Cohen, JD ;
Mahan, AH .
APPLIED PHYSICS LETTERS, 1999, 74 (13) :1860-1862
[2]  
HAYASHI R, 1998, P WCPEC, V2, P929
[3]   Optimization of hydrogenated amorphous silicon p-i-n solar cells with two-step i layers guided by real-time spectroscopic ellipsometry [J].
Koh, JH ;
Lee, YH ;
Fujiwara, H ;
Wronski, CR ;
Collins, RW .
APPLIED PHYSICS LETTERS, 1998, 73 (11) :1526-1528
[4]   PLASMA SPECTROSCOPY GLOW-DISCHARGE DEPOSITION OF HYDROGENATED AMORPHOUS-SILICON [J].
MATSUDA, A ;
TANAKA, K .
THIN SOLID FILMS, 1982, 92 (1-2) :171-187
[5]   Relationship between the photo-induced degradation characteristics and film structure of a-Si:H films prepared under various conditions [J].
Nishimoto, T ;
Takai, M ;
Kondo, M ;
Matsuda, A .
CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000, 2000, :876-879
[6]   Effect of halogen additives on the stability of a-Si:H films deposited at a high-growth rate [J].
Nishimoto, T ;
Takagi, T ;
Kondo, M ;
Matsuda, A .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2001, 66 (1-4) :179-185
[7]   DISSOCIATIVE EXCITATION OF SIH4, SID4, SI2H6 AND GEH4 BY 0-100 EV ELECTRON-IMPACT [J].
PERRIN, J ;
AARTS, JFM .
CHEMICAL PHYSICS, 1983, 80 (03) :351-365
[8]  
SANO M, 2001, PVSEC, V12, P45
[9]   Guiding principles for obtaining stabilized amorphous silicon at larger growth rates [J].
Takai, M ;
Nishimoto, T ;
Takagi, T ;
Kondo, M ;
Matsuda, A .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 266 :90-94
[10]   Effect of higher-silane formation on electron temperature in a silane glow-discharge plasma [J].
Takai, M ;
Nishimoto, T ;
Kondo, M ;
Matsuda, A .
APPLIED PHYSICS LETTERS, 2000, 77 (18) :2828-2830