Well-width dependence of the ground level emission of GaN/AlGaN quantum wells

被引:39
作者
Bonfiglio, A [1 ]
Lomascolo, M
Traetta, G
Cingolani, R
Di Carlo, A
Della Sala, F
Lugli, P
Botchkarev, A
Morkoc, H
机构
[1] Univ Lecce, INFM, Dipartimento Ingn Innovaz, I-73100 Lecce, Italy
[2] Univ Roma Tor Vergata, Dipartimento Ingn Elettron, I-00133 Rome, Italy
[3] Virginia Commonwealth Univ, Richmond, VA 23173 USA
[4] CNR, IME Ist Studio Nuovi Mat Elettron, I-73100 Lecce, Italy
[5] Univ Cagliari, INFM, Dipartimento Ingn Elettr & Ellettron, I-09124 Cagliari, Italy
关键词
D O I
10.1063/1.372175
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have performed a systematic investigation of GaN/AlGaN quantum wells grown on different buffer layers (either GaN or AlGaN) in order to clarify the role of strain, structural parameters, and built-in field in determining the well-width dependence of the ground level emission energy. We find that identical quantum wells grown on different buffer layers exhibit strong variation of the ground level energy but similar well-width dependence. The data are quantitatively explained by an analytic model based on the envelope function formalism which accounts for screening and built-in field, and by a full self-consistent tight binding model. (C) 2000 American Institute of Physics. [S0021-8979(00)09105-2].
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收藏
页码:2289 / 2292
页数:4
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