Wideband Reference-Plane Invariant Method for Measuring Electromagnetic Parameters of Materials

被引：113

作者：

Chalapat, Khattiya ^{[2
]}

Sarvala, Kari ^{[2
]}

Li, Jian ^{[1
]}

Paraoanu, Gheorghe Sorin ^{[1
]}

机构：

[1] Helsinki Univ Technol, Low Temp Lab, FI-02015 Espoo, Finland

[2] Univ Jyvaskyla, Dept Phys, Nanosci Ctr, Jyvaskyla 40101, Finland

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2009年 / 57卷 / 09期

基金：

芬兰科学院;

关键词：

Broadband measurement; electric permittivity; magnetic permeability; reference-plane invariant (RPI) method; refractive index measurement; transmission/reflection (TR) method; COMPLEX PERMITTIVITY DETERMINATION; TRANSMISSION-REFLECTION METHOD; PERMEABILITY;

D O I：

10.1109/TMTT.2009.2027160

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

080906 [电磁信息功能材料与结构]; 082806 [农业信息与电气工程];

摘要：

This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (noniterative) and reference-plane invariant: it uses a certain combination of scattering parameters in conjunction with group-velocity data. This technique can be used to characterize both dielectric and magnetic materials. The proposed method is verified experimentally within a frequency range between 2-18 GHz on polytetrafluoroethylene and polyvinylchloride samples. A comprehensive error and stability analysis reveals that, similar to other methods based on transmission/reflection measurement, the uncertainties are larger at low frequencies and at the Fabry-Perot resonances.

引用

页码：2257 / 2267

页数：11

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