The role of surface chemistry in bonding of standard silicon wafers

被引:60
作者
Tong, QY
Lee, TH
Gosele, U
Reiche, M
Ramm, J
Beck, E
机构
[1] MAX PLANCK INST MICROSTRUCT PHYS,D-06120 HALLE,GERMANY
[2] BALZERS AG,FL-9496 BALZERS,LIECHTENSTEIN
关键词
D O I
10.1149/1.1837415
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 [应用化学];
摘要
Hydrophilic silicon surfaces become hydrophobic without microroughening after 200 degrees C low energy hydrogen plasma cleaning. The fully hydrogen-terminated silicon surfaces do not bond to each other, not even by the application of external pressure. A subsequent 400 to 600 degrees C, 4 min thermal treatment in ultrahigh vacuum converts the wafer surfaces to hydrophilic and bondable which can be attributed to desorption of hydrogen from the surfaces. Hydrophobic silicon surfaces prepared by a dip in HF (without subsequent water rinse) are terminated by H and a small amount of F, or by H and a small amount of OH (after subsequent water rinse). Hydrogen bonding of Si-F ...(HF)... H-Si or Si-OH ...(HOH)... OH-Si across the two mating surfaces appears to be responsible for room temperature spontaneous hydrophobic or hydrophilic wafer bonding, respectively.
引用
收藏
页码:384 / 389
页数:6
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