Surface segregational behaviour studied as an effect of thickness by SIMS and AFM in annealed PS-PMMA blend and block copolymer thin films

被引:13
作者
Kailas, L.
Audinot, J. -N.
Migeon, H. -N.
Bertrand, P.
机构
[1] Univ Catholique Louvain, Unite PCPM, B-1348 Louvain, Belgium
[2] Ctr Rech Gabriel Lippmann, Lab Anal Mat, L-1511 Luxembourg, Luxembourg
关键词
ToF-SIMS; Nano-SIMS; AFM; diblock copolymers; symmetric blends; thin films; surface characterization; morphology; phase separation;
D O I
10.1163/156855406777408610
中图分类号
TB33 [复合材料];
学科分类号
摘要
The surface behaviour of a two-phase polymer mixture depends on the chemical structure of the polymer components, the interaction between the two polymers and the processing conditions. The microscopic morphology and the surface composition need to be known in order to fully utilize the thin film properties. The technique of static time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used to obtain the molecular surface composition of thin films of blends and block copolymers. The depth profiling tool of Nano-SIMS, a dynamic SIMS technique, helps to provide the chemical mapping of the surface in 2D and 3D. The surface morphology is investigated using AFM. Thin films of PS and PMMA diblock copolymers with molecular weight of 12K-12K and 10K-10K and blends of PS/PMMA (10K/10K) for thicknesses ranging from 5 nm to 50 nm are examined. For the blends, the ToF-SIMS spectra for all the thicknesses show the same behaviour of a high increase of PMMA on the surface after annealing. Nano-SIMS images reveal the formation of nanostructures on the annealed surfaces and AFM studies show these nanostructures to be droplets having distinct phase shift from the surrounding matrix. The droplet dimensions increase with the increase of the thickness of the film but the absolute intensity from the ToF-SIMS spectra for all the annealed films remains almost the same. For the copolymers, the ToF-SIMS spectra show that there is a decrease of PMMA on the surface for the annealed films when compared to the as-cast ones. AFM morphology reveals that, for different thicknesses, annealing induces different topographical features like droplets, holes, spinodal patterns, etc. but with no distinct phase shift between the patterns and the surrounding matrix. The two different copolymers of comparable molecular weight are found to exhibit very different topography even when the thickness of the films remained the same. The surface composition from the ToF-SIMS data, however, was not found to vary even when the topography was completely different.
引用
收藏
页码:423 / 439
页数:17
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