Atomistic simulation and analysis of plasticity in amorphous silicon

被引:31
作者
Argon, AS
Demkowicz, MJ
机构
[1] MIT, Dept Mech Engn, Cambridge, MA 02139 USA
[2] Los Alamos Natl Lab, Los Alamos, NM USA
关键词
D O I
10.1080/14786430600596852
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The principal findings of a comprehensive computational simulation of plastic flow in amorphous Si - presented elsewhere in detail - are summarized. The unit plastic events have been identified to consist of discrete shear transformations triggered at characteristic thresholds of stress that result in transformation shear strains of about 0.015. Based on these findings, a kinetic model of plastic flow is proposed that provides for the temperature dependence of the plastic flow resistance and explains the evolution of a unique flow state starting from different amorphous structures. It is proposed that these findings should be broadly applicable to other strongly bonded glassy covalent compounds.
引用
收藏
页码:4153 / 4172
页数:20
相关论文
共 52 条
[42]  
McClintock FA, 1966, MECH BEHAV MAT
[43]   THE ATOMIC STRAIN TENSOR [J].
MOTT, PH ;
ARGON, AS ;
SUTER, UW .
JOURNAL OF COMPUTATIONAL PHYSICS, 1992, 101 (01) :140-150
[44]   ATOMISTIC MODELING OF PLASTIC-DEFORMATION OF GLASSY-POLYMERS [J].
MOTT, PH ;
ARGON, AS ;
SUTER, UW .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1993, 67 (04) :931-978
[45]  
Phillpot S. R., 1989, Computers in Physics, V3, P20
[46]   Liquid-liquid phase transition in supercooled silicon [J].
Sastry, S ;
Angell, CA .
NATURE MATERIALS, 2003, 2 (11) :739-743
[47]   MICROSCOPIC MECHANISM FOR STEADY-STATE INHOMOGENEOUS FLOW IN METALLIC GLASSES [J].
SPAEPEN, F .
ACTA METALLURGICA, 1977, 25 (04) :407-415
[48]   AN ATOMISTIC STUDY OF DEFORMATION OF AMORPHOUS METALS [J].
SROLOVITZ, D ;
VITEK, V ;
EGAMI, T .
ACTA METALLURGICA, 1983, 31 (02) :335-352
[49]   COMPUTER-SIMULATION OF LOCAL ORDER IN CONDENSED PHASES OF SILICON [J].
STILLINGER, FH ;
WEBER, TA .
PHYSICAL REVIEW B, 1985, 31 (08) :5262-5271
[50]   NEW EMPIRICAL-MODEL FOR THE STRUCTURAL-PROPERTIES OF SILICON [J].
TERSOFF, J .
PHYSICAL REVIEW LETTERS, 1986, 56 (06) :632-635