Characterization of Cd1-xZnxTe crystals grown from a modified vertical Bridgman technique

被引:12
作者
Cui, Y. [1 ]
Groza, M.
Wright, G. W.
Roy, U. N.
Burger, A.
Li, L.
Lu, F.
Black, M. A.
James, R. B.
机构
[1] Fisk Univ, Ctr Excellence Phys & Chem, Nashville, TN 37208 USA
[2] Yinnel Tech Inc, South Bend, IN 46619 USA
[3] Brookhaven Natl Lab, Upton, NY 11973 USA
关键词
CZT; photoluminescence; DC photoconductivity; Pockels effect; radiation detector;
D O I
10.1007/s11664-006-0253-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cd1-xZnxTe (CZT) crystals grown from a modified vertical Bridgman technique were characterized by means of an optical polarized transmission technique using the Pockels effect, low-temperature direct current (DC) photoconductivity technique, low-temperature photoluminescence (PL) spectroscopy, room-temperature PL mapping technique, and detector performance measurements. Electric field mapping indicates that an approximation of a uniform electric field distribution approximation is generally satisfied for CZT detectors operated at room temperature under typical working conditions. A nonuniform electric field distribution is observed under intense infrared (IR) light illumination, and a model is proposed based on charge generation of defects, trapping, and space-charge effects. The largest hole mobility-lifetime product (mu tau)(h) of the CZT detector measured by DC photoconductivity is 7.0 X 10(-4) cm(2)/V. The detector treated with 2% bromine in methanol chemical etch has a relatively small surface recombination velocity at room temperature, which was obtained from DC photocurrent and detector performance tests, as measured by irradiation of 5.5-MeV alpha particles and 59.6-keV gamma-rays, respectively. We have clearly shown the equivalence of charge collection efficiency results measured by both DC photocurrent and a particle response. Low-temperature DC photocurrent measurements show that surface recombination velocity increases significantly with decreasing temperature from 300 K to 250 K. The effective electron mobility-lifetime product-combination effects of bulk and surface of CZT crystal-increases with increment of temperature. Room-temperature PL mapping measurements indicate uniformity of zinc concentration within CZT crystals. Low-temperature PL spectroscopy shows that the dominant emission peaks are excitons, which are bound to either shallow neutral donors (D-0, X) or neutral acceptors (A(0), X), depending on the temperature, concentration of donors and acceptors, and the incident light intensity. It was found that the luminescence of (DO, X) depends linearly on the incident laser intensity, while (A(0), X) has a nonlinear dependence.
引用
收藏
页码:1267 / 1274
页数:8
相关论文
共 20 条
[1]   CHARGE-TRANSPORT IN ARRAYS OF SEMICONDUCTOR GAMMA-RAY DETECTORS [J].
BARRETT, HH ;
ESKIN, JD ;
BARBER, HB .
PHYSICAL REVIEW LETTERS, 1995, 75 (01) :156-159
[2]   Characterization of large single-crystal gamma-ray detectors of cadmium zinc telluride [J].
Burger, A ;
Groza, M ;
Cui, Y ;
Hillman, D ;
Brewer, E ;
Bilikiss, A ;
Wright, GW ;
Li, L ;
Fu, F ;
James, RB .
JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (07) :756-760
[3]   Low-temperature photoluminescence of detector grade Cd1-xZnxTe crystal treated by different chemical etchants [J].
Chen, H ;
Tong, J ;
Hu, Z ;
Shi, DT ;
Wu, GH ;
Chen, KT ;
George, MA ;
Collins, WE ;
Burger, A ;
James, RB ;
Stahle, CM ;
Bartlett, LM .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (06) :3509-3512
[4]   Surface treatments and their effects on the performance of Cd1-xZnxTe radiation detectors [J].
Cui, Y ;
Wright, G ;
Kolokolnikov, K ;
Barnett, C ;
Reed, K ;
Roy, UN ;
Burger, A ;
James, RB .
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS III, 2001, 4507 :12-22
[5]   Study of surface recombination velocity of Cd1-xZnxTe radiation detectors by direct current photoconductivity [J].
Cui, Y ;
Groza, M ;
Hillman, D ;
Burger, A ;
James, RB .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2556-2560
[6]   DC photoconductivity study of semi-insulating Cd1-xZnxTe crystals [J].
Cui, Y ;
Wright, GW ;
Ma, X ;
Chattopadhyay, K ;
James, RB ;
Burger, A .
JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (06) :774-778
[7]   Infra-red microscopy of Cd(Zn)Te radiation detectors revealing their internal electric field structure under bias [J].
DeAntonis, P ;
Morton, EJ ;
Podd, FJW .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (03) :1487-1490
[8]  
Hjelt K, 1997, PHYS STATUS SOLIDI A, V162, P747, DOI 10.1002/1521-396X(199708)162:2<747::AID-PSSA747>3.0.CO
[9]  
2-2
[10]  
Li L, 2002, IEEE NUCL SCI CONF R, P2396, DOI 10.1109/NSSMIC.2001.1009303