Copper metallization for advanced IC: requirements and technological solutions

被引:53
作者
Morand, Y [1 ]
机构
[1] STMicroelect, CEA G LETI, F-38054 Grenoble 9, France
关键词
copper; damascene; CMP; electromigration;
D O I
10.1016/S0167-9317(99)00307-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Due to the scaling down, the contribution of interconnects should become preponderant for the performance of IC. The use of low-k dielectrics and/or low resistivity metals in order to decrease the parasitic capacitance of interconnect is a technological requirement. Especially the use of copper, with mineral dielectric as IMD, instead of aluminium alloy is now commonly accepted. In this paper we compare the intrinsic performance of two damascene architectures. The planarization by metal CMP which will determine the final metal thickness, may induce killer defects (shorts between lines) or degraded metal sheet resistance uniformity for multi-level metallization devices. The impact on electromigration of the damascene structure is presented: due to the reverse architecture, the grain sizes and orientations are found to be linewidth dependent. On the other hand, the life times extrapolated with different copper and barrier deposition processes vary on a large range: from similar to those obtained with aluminium for a full CVD metallization (barrier + copper) to more than one order of magnitude higher for a CVD barrier and a mixed CVD + PVD copper deposition. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:391 / 401
页数:11
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