Terabit-per-square-inch data storage with the atomic force microscope

被引：144

作者：

Cooper, EB

Manalis, SR ^{[1
]}

Fang, H

Dai, H

Matsumoto, K

Minne, SC

Hunt, T

Quate, CF

机构：

[1] MIT, Media Lab, Cambridge, MA 02139 USA

[2] Stanford Univ, Dept Chem, Stanford, CA 94305 USA

[3] Electrotech Lab, Tsukuba, Ibaraki 305, Japan

[4] Stanford Univ, Edward L Ginzton Lab, Stanford, CA 94305 USA

来源：

APPLIED PHYSICS LETTERS | 1999年 / 75卷 / 22期

关键词：

D O I：

10.1063/1.125390

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An areal density of 1.6 Tbits/in.(2) has been achieved by anodically oxidizing titanium with the atomic force microscope (AFM). This density was made possible by (1) single-wall carbon nanotubes selectively grown on an AFM cantilever, (2) atomically flat titanium surfaces on alpha-Al2O3 (1012), and (3) atomic scale force and position control with the tapping-mode AFM. By combining these elements, 8 nm bits on 20 nm pitch are written at a rate of 5 kbit/s at room temperature in air. (C) 1999 American Institute of Physics. [S0003-6951(99)02248-2].

引用

页码：3566 / 3568

页数：3

共 27 条

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